This project is to produce a “mini” parts tracking system for each of 3 manufacturing stations so that when the wafer is cut up at the end, data can be provided to sort heads into the 4 categories. Data will also be used for reporting on manufacturing yields. You will be given a Test Case to analyze which describes the results at each of the 3 manufacturing stations.
Station A - Visual inspection after 1st layer applied. The operator is asked to look into a microscope at the heads on the 4 corners of the wafer and type in if each looked good (1,1), bad (0,0), ID (0,1) or OD (1,0). Data should be saved as a result of this operation. All untested heads should be assumed to be good (1,1).
Station B – Automatic tester / inspection after 2nd layer applied. All head positions are automatically tested. You will be reading in a file giving the results of Station B testing. The file will be given to you and will have the filename: ATE_Result_X.txt . You will be told what version of test case file you should use (identified by the character X). All data should be saved as a result of this operation.
Station C – After another manufacturing process, a visual inspection is done on the 1st row only. Untested rows should be assumed to have all good heads. All data from station C should be stored.
Note: Each station will perform its test and then fill in a separate matrix containing its test results. There will be three matrices created, one for each station, after each wafer passes through all three stations. The three matrices are then merged together into the Cumulative Result matrix.